Como usar apowersoft screen recorder. Eg2001 prober setup manual – About this Manual TSK UF200 and UF200AL Partial Top Load Prober Interface Installation Manual The purpose of this manual is to provide installation instructions Remote / Manual light on-off control with long life high-bright LED illumination Movement Temperature compensation option as EG2001 ATE,Prober,Handler,Docking,半导 技术天地.
Uf200 Prober Manual Pdf
- Accretech / TSK UF 200 Prober - Missing Parts. 425 30th Street Suite 26 Newport Beach, CA 92663 USA Office:+1949.396.1395.
- We can provide majority of popular tester to prober interface hardware for either 'Hard docking' or 'Soft docking' applications. Probe Cleaning needs. We can provide our customers with the latest hardware & materials fr any kind of prober cleaning applications (Vertical, Cascade, or Cantilever probes.
- Prober: TSK UF200 – Standard 50mm cleaning block. Online Cleaning – MIPOX WA6000 SWE (if you want your needle tips behave like a vertical, treat it like one). Test – Currents up to 200mA per pin 5.
- Title spare part no. 1: top hinge:: 2: hook of lock:: 3: sticker for front panel black:: 4: front panel black:: 5.
Vlc player for mac gezginler. Precio™ XL
Precio™ XL is the latest 300mm fully automated wafer prober developed based on TEL Precio™ series. The Precio™ XL realizes high productivity, contact performance, cleanliness improvement, and short delivery time with a concept to further reduce test costs. TEL has also provided high-speed probe mark inspection TELPADS™-I and Auto Leveling (the probe card parallelism Automatic adjustment function), Users have available to them ZOOM-I which supports various Z-axis control for stable contact and soft contact, as option. The Precio™ XL wafer prober is compatible with the wafer parameters of previous Precio™ models. In addition, focusing not only on test operations but also on efficiency of setup file generation, we have introduced CoSMOz (Contact Sequence Map Optimization) software option. CoSMOz has the capability to calculate the optimum contact sequence, which was previously performed by customer test engineers. We have realized significant improvement in work efficiency and improvement in test efficiency.
Wafer Prober Machine
- Most significant machine model for 300mm wafers
High precision, high rigidity, high throughput machine. - Better cost performance for 300mm wafers.
- 300mm Framed wafer & CSP handling machine.
- It is the prober with high-speed probing that targets non-memory device.
- Most significant machine model for 200mm wafers
High precision, high rigidity machine. - Highly efficient, High throughput, wafer & CSP handling machine.
Better cost performance machine. - High-speed machine for discrete.
- 200mm Framed wafer & CSP handling machine
- Accretech Probing Machine for full wafer testing on a single touch down. Developed with capability to simultaneously measure on 12 stages with dedicate XY stage and POGO tower.
- Consolidated management of the operation of probing machines for higher operation rate.
- This network allows you to consolidate the management of resources with the user host.
- The GEM Network System supports standards based on the SEMI standards to achieve factory automation at customers.
- This is a group of dedicated terminals for increasing the efficiency of test areas.